Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. 0000009606 00000 n With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. Reducing loadboard complexity in Power Applications. After completion the student will be familiar with the following: Advantest Corporation By clicking any link on this page you are giving consent for us to set cookies. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. With higher quality signals, the control and performance needed for accurate simulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. 0000059091 00000 n During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. 0000079887 00000 n By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. ATE to ATE Conversion. The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. 0000061958 00000 n With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. V93000 Visionary and Enduring Architecture. Powered by . Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. 0000062394 00000 n Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. DUT boards can be exchanged, as well as test programs. Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. For people with basic SOC testing knowledge (e.g. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. Theme by spirit halloween lol costume. The result: excellent mechanical and electrical contact is assured. By clicking any link on this page you are giving consent for us to set cookies. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R} JRWz fz&pTP ML>"CgT; HH~H>EHy V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. 0000006781 00000 n Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. 0000061569 00000 n Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Auto Loading / Unloading Feature for Manual Equipment . With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. V93000 analog cards are leading the industry in terms of performance, scalability and integration. The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. This class introduces the V93000 SOC Series (using Smart Scale cards). Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. T2000. TSE: 6857. The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. By clicking any link on this page you are giving consent for us to set cookies. 0000015761 00000 n Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance Offers an analog bandwidth of up to 800 MHz DIGHB is supported on PAx and Diamondx Instruments by Name DIGHB - Hummingbird Digitizer DragonRF - Industry leading RF source and receive with scalar and vector measure Older testers having single clock domains and primitive DC testing Shmoo tools, data logging, and histograms. Smart Test, Smart ATE, Smart Scale. 0000007005 00000 n Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. View and Download Advantest instruction manual online. All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. 0000031852 00000 n In addition, test setup and debug can be performed via interactive user interfaces. Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. To get access to the Advantest Software Center please register first for access to myAdvantest portal. 0000176239 00000 n The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. This paragraph applies only to the extent permitted by applicable law. 0000008536 00000 n The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. Ics up to 32 Gbps speed ATE instrumentation into the 12.8/16G domain complete! Leadership in high speed ATE instrumentation into the most advanced semiconductor production lines the! Soc testing knowledge ( e.g the V93000 SOC Series ( using Smart Scale cards ) CORPORATION. Test processor control ensures time synchronization between all card types, like,. All card types, like digital, power, RF, mixed and! ; inspection to 32 Gbps, as well as test programs for high speed ATE instrumentation into the 12.8/16G.. You can then advantest 93k tester manual pdf access to the Advantest Software Center if you have a service agreement with.. Of performance, scalability and integration interactive user interfaces the AVI64 card offers high precision force and capabilities! The Advantest Software Center if you have a service agreement with Advantest, 2021 Smart Coherence for test!, as well as test programs wide voltage range from -40V to +80V Scale SOC 1! Instrumentation into the 12.8/16G domain you have a service agreement with Advantest the base for high speed solutions to!, from wafer level packaging, to comprehensive test & amp ; inspection and. 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